Engineer, PE GFX ATE

Job Title

Engineer, PE GFX ATE (Product Engineer - High-Speed ATE Test, GDDR)

Role Summary

Responsible for ownership of high-speed ATE test for graphics-class DRAM (GDDR) through wafer and package production ramps. The role focuses on test program development, high-speed I/O characterization, failure analysis, and yield/quality/cost improvements.

This is a hands-on engineering role working with cross-functional teams to deliver clean production ramps and apply automation and AI to accelerate test and analysis workflows.

Experience Level

Mid-level (mid-to-senior experience expected). The posting indicates candidates typically have 4+ years of relevant ATE/product-test engineering experience.

Responsibilities

Key duties include production ramp support, test development, characterization, failure analysis, and driving test automation and cost reduction.

• Ramp high-speed GDDR-class products into high-volume production on ATE (wafer/probe and package), meeting yield, quality, and cost targets.
• Develop, debug, validate, and optimize high-speed test programs and test content; advance Design-for-Test (DFT) strategy.
• Perform high-speed I/O characterization and margining (data-eye, timing-margin analysis, AC timing extraction across corners).
• Lead electrical and physical failure analysis; drive root cause to closure and reduce DPM/quality escapes.
• Reduce test time and cost-per-unit through pattern and test-content optimization.
• Monitor and analyze yield and parametric test data (probe, burn-in, final-test); align test results across sites.
• Manage scrap/material disposition and RMA/customer-return failure analysis; ensure specification alignment.
• Partner cross-functionally with design, product/test engineering, manufacturing, and quality; present findings and drive multi-site decisions.
• Design and deploy automation and AI-assisted workflows for test-program generation, unattended test orchestration, large-scale corner/timing sweeps, and failure analytics.

Requirements

Must-have

• Hands-on experience developing, debugging, and optimizing ATE test programs for high-speed devices.
• Strong high-speed I/O and characterization skills: data-eye/timing-margin analysis, AC timing extraction, parametric data interpretation.
• Proven track record of yield improvement and reducing DPM/quality escapes.
• Solid electrical and physical failure-analysis skills with structured root-cause methodology.
• Strong programming/scripting ability and experience working with large test datasets.

Preferred / Nice-to-have

• Experience with GDDR or other high-speed memory (DDR, LPDDR, HBM) or high-speed serial I/O.
• DFT development experience and leadership in test-time/cost reduction.
• Experience automating test flows or applying AI/ML or agentic tools to engineering data and workflows.
• Experience with system-level test and cross-functional multi-site production ramps.
• Strong written and verbal communication skills.

Education Requirements

Degree in Electrical Engineering, Computer Engineering, Physics, or a related technical field is stated as the expected academic background. The posting also notes ATE product/test engineering experience commensurate with a mid/senior level (typically 4+ years).

About the Company

Company: Micron Technology

Headquarters: Boise, Idaho, USA

Micron Technology is a global leader in memory and storage solutions, dedicated to transforming how the world uses information. The company offers a diverse portfolio of high-performance DRAM, NAND, and NOR memory products under the Micron and Crucial brands. With a commitment to customer focus and technological innovation, Micron drives advancements in artificial intelligence, 5G, and other data-centric applications, empowering users to learn, communicate, and progress.