Senior/Staff Engineer, NTI Metrology

Job Title

Senior/Staff Engineer, NTI Metrology

Role Summary

Lead development, qualification and deployment of advanced metrology applications for 3D NAND process development at Fab 10N/X, Singapore. Primary focus on Focused Ion Beam (FIB) and related characterization techniques (e.g., AFM, SEM, WLI) to close inline detection gaps and accelerate process learning.

Work cross-functionally with Process Integration, Yield Enhancement, Process Development and Manufacturing teams and with equipment suppliers to deliver measurement capability, automation, and manufacturing readiness.

Experience Level

Senior - minimum 7 years of semiconductor metrology development experience; at least 5 years hands-on FIB experience and hands-on experience with one or more additional advanced metrology techniques.

Responsibilities

Accountable for metrology application development, qualification, and technology roadmaps that support NAND process development and manufacturing deployment.

• Develop and implement metrology solutions using FIB, AFM, SEM, WLI and related techniques to enable inline detection and process learning.
• Evaluate, qualify and deploy next-generation metrology systems and First-of-a-Kind (FOAK) technologies; assess capability, accuracy, repeatability, throughput, automation, and manufacturing readiness.
• Establish technology roadmaps and drive alignment with future NAND requirements; manage technical relationships with suppliers and collaborators.
• Use metrology data, defect detection, AI/ML and modeling to correlate measurements with electrical failure signatures, reliability, yield and performance.
• Collaborate with Process Integration, Yield Enhancement, Process Development and Manufacturing teams to enable rapid technology transfer and deployment.

Requirements

Essential skills and experience required for the role.

• Minimum 7 years of semiconductor metrology development experience with demonstrated ownership of new metrology applications, recipes, methodologies or inline monitoring solutions across advanced characterization platforms.
• Minimum 5 years hands-on experience in Focused Ion Beam (FIB) plus hands-on experience with at least one additional technique: AFM, WLI, or SEM.
• Proven track record in developing metrology solutions for process characterization, inline monitoring, root-cause analysis, yield improvement and reliability investigations.
• Experience qualifying new metrology technologies, engaging directly with suppliers, and establishing application capability and roadmaps.
• Experience applying metrology data analytics and familiarity with AI/ML techniques to extract actionable insights.
• Candidates primarily limited to process engineering, yield engineering, failure analysis, or data analysis without direct metrology application development responsibility will not be considered.

Education Requirements

Master's or PhD in Materials Science, Mechanical Engineering, Electrical Engineering, Applied Physics, or a closely related technical field (degree specified in source).

About the Company

Company: Micron Technology

Headquarters: Boise, Idaho, USA

Micron Technology is a global leader in memory and storage solutions, dedicated to transforming how the world uses information. The company offers a diverse portfolio of high-performance DRAM, NAND, and NOR memory products under the Micron and Crucial brands. With a commitment to customer focus and technological innovation, Micron drives advancements in artificial intelligence, 5G, and other data-centric applications, empowering users to learn, communicate, and progress.