Senior Engineer, Metrology Process Development

Job Title

Senior Engineer, Metrology Process Development

Role Summary

Lead development, qualification, and sustainment of advanced critical-dimension (CD) and related metrology for wafer fabrication (CD-SEM, AFM, overlay/registration, X-ray, and optical methods). Work closely with process, integration, design, and supplier teams to define metrology requirements, enable inline detection strategies, and ensure pattern fidelity for advanced nodes.

Experience Level

Senior level. The role expects demonstrated industry metrology experience (typical guidance: 5+ years for senior-level responsibilities, with responsibility for mentoring and influencing suppliers).

Responsibilities

Deliver technical leadership for metrology methods and operations supporting advanced patterning and scaling.

• Lead R&D, operation, and sustainment of CD-SEM metrology and related techniques (AFM, overlay, X-ray, optical).
• Develop, qualify, and standardize CD metrology methods to achieve high accuracy, precision, and repeatability.
• Drive inline detection and monitoring strategies with process and integration teams for rapid learning cycles.
• Perform CD, profile, and roughness analysis to diagnose process issues and maintain pattern fidelity.
• Define metrology requirements and monitoring schemes with design and process partners.
• Produce clear metrology reports with data interpretation, root-cause analysis, and actionable recommendations.
• Benchmark tools, innovate methods, and optimize workflows to advance CD metrology capabilities.
• Mentor and coach engineering staff to build metrology capability and continuous improvement culture.
• Influence supplier tool and technology roadmaps to support next-generation CD and patterning needs.

Requirements

Core technical and hands-on skills required to perform the role effectively. Education details are summarized separately under Education Requirements.

• Must-have: Industry experience in metrology and instrumentation, including hands-on work with CD-SEM, AFM, overlay/registration, X-ray metrology, or optical thin-film techniques (practical calibration and equipment procedures).
• Must-have: Solid understanding of semiconductor manufacturing processes (diffusion, CVD, etch, lithography) and device process flows.
• Must-have: Strong digital literacy with data analysis tools; experience with data science/AI techniques and JMP or equivalent analytics tools.
• Must-have: Ability to analyze CD, profile, and roughness data and translate findings into actionable process recommendations.
• Must-have: Effective written and verbal communication skills; ability to produce clear technical reports and work cross-functionally.
• Nice-to-have: Experience mentoring engineers, influencing supplier roadmaps, and benchmarking advanced metrology tools.
• Nice-to-have: Prior track record of developing inline detection strategies and workflow optimizations for advanced nodes.

Education Requirements

Preferred: MS or Ph.D. in Engineering, Physics, Materials Science, or a related technical field plus 2+ years of industry metrology experience. Acceptable alternative: BS in a related field with 5 years of proven semiconductor/metrology experience. Equivalent practical experience in lieu of a degree is implied by the stated alternatives.

About the Company

Company: Micron Technology

Headquarters: Boise, Idaho, USA

Micron Technology is a global leader in memory and storage solutions, dedicated to transforming how the world uses information. The company offers a diverse portfolio of high-performance DRAM, NAND, and NOR memory products under the Micron and Crucial brands. With a commitment to customer focus and technological innovation, Micron drives advancements in artificial intelligence, 5G, and other data-centric applications, empowering users to learn, communicate, and progress.