Senior Defect/Yield Engineer

Job Title

Senior Defect/Yield Engineer

Role Summary

Senior consultant engineer at PDF Solutions using e-beam (eProbe) systems to improve yield in 300mm semiconductor fabs. The role combines experiment design, data analysis, and customer-facing technical consulting to drive defect reduction and yield improvement.

Opportunity to apply measurement and data-analysis techniques to production yield challenges in a technical consulting setting.

Experience Level

Senior-level. No specific years of experience stated.

Responsibilities

Primary duties include experiment design, analysis of e-beam outputs, and delivery of actionable results to customers.

• Analyze PDF eProbe output to identify defects and maximize customer yield improvement.
• Design and execute R&D experiments to retarget defects, strengthen signals, reduce noise, or improve throughput.
• Create repeatable dataflows and analysis processes for consistent readout.
• Produce high-quality technical analysis reports summarizing findings and recommendations.
• Engage with customers to encourage use of eProbe readouts for yield improvement.

Requirements

Must-have technical skills and preferred additional abilities:

• Proficiency with layout review/edit tools (e.g., Cadence ICFB, KLayout).
• Experience with data-analysis platforms (e.g., JMP, Spotfire).
• Experience diagnosing semiconductor fail modes in FEOL and BEOL process steps.
• Basic device physics understanding (P–N junctions, transistor operation, CMOS integration).
• Ability to run experiments rapidly and produce clear, concise analysis reports.
• Preferred: experience with inspection tools (optical, voltage-contrast, spectroscopy); ability to read/interpret schematics, GDS/Oasis layouts, or PFA cross-sections; programming skills (Python, Java, C#, C++, Ruby, Perl); prior customer-facing technical consulting experience.

Education Requirements

Not specified.

About the Company

Company: PDF Solutions

Headquarters: San Jose, California, United States

PDF Solutions provides data-driven software and inspection systems for semiconductor manufacturing, focusing on yield enhancement, process control and advanced e-beam inspection platforms for leading-edge fabs.